Measurement methods and characterization

Optical measuring methods and systems are developed to meet customer-specific requirements and internal needs. Key areas include the characterization of optical and nonoptical surfaces, coatings, components and systems in the micro and sub-nano range as well as 3D shape measurement. First results of microstructure analysis using THz tomography were obtained in 2010.

Your contacts at the institutes are:

Contact Press / Media

Prof. Dr. rer. nat Gunther Notni

Fraunhofer Institute for Applied Optics and Precision Engineering IOF
Albert-Einstein-Str. 7
07745 Jena

Phone +49 3641 807-217

Fax +49 3641 807-602

Contact Press / Media

PD Dr. rer. nat. Reinhard Noll

Fraunhofer Institute for Laser Technology ILT
Steinbachstr. 15
52074 Aachen

Phone +49 241 8906-138

Fax +49 241 8906-121

Contact Press / Media

Dr. Olaf Zywitzki

Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology
Winterbergstr. 28
01277 Dresden

Phone +49 351 2586-180

Fax +49 351 2586-55180

Contact Press / Media

Dr. Kirsten Schiffmann

Fraunhofer Institute for Surface Engineering and Thin Films IST
Bienroder Weg 54 e
38108 Braunschweig

Phone +49 531 2155-577

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Dr. Wulf Grählert

Fraunhofer Institute for Material and Beam Technology IWS
Winterbergstr. 28
01277 Dresden

Phone +49 351 83391-3406

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Dr. rer. nat. Joerg Kaspar

Fraunhofer Institute for Material and Beam Technology IWS
Winterbergstr. 28
01277 Dresden

Phone +49 351 83391-3216

Contact Press / Media

Dr. Heinrich Höfler

Fraunhofer Institute for Physical Measurement Techniques IPM
Heidenhofstr. 8
79110 Freiburg

Phone +49 761 8857-173

Fax +49 761 8857-224